Accidental surface contamination - The effect on trace element analysis

Authors
Franklyn, CB Ueckermann, H Merkle, RKW
Citation
Cb. Franklyn et al., Accidental surface contamination - The effect on trace element analysis, NUCL INST B, 181, 2001, pp. 145-149
Citations number
2
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
181
Year of publication
2001
Pages
145 - 149
Database
ISI
SICI code
0168-583X(200107)181:<145:ASC-TE>2.0.ZU;2-T
Abstract
We discuss the accidental contamination of samples during a micro-PIXE stud y of Rh, Pd and Pt partition coefficients in the Fe-S and Ni-S systems. Tra ce amounts of Ni and Cu, mounted separately in epoxy as markers, were found to be present in various phases in the sections, sometimes selectively in specific mineral phases. This contamination is believed to result from poli shing during preparation. Further surface contamination from conductive Ag paste was also observed. (C) 2001 Elsevier Science B.V. All rights reserved .