Mv. Chukalina et U. Watjen, Mathematical reconstruction of sample microstructures obtained from PIXE elemental maps, NUCL INST B, 181, 2001, pp. 249-253
A software package developed for quantitative characterization of microstru
ctures with particle-induced X-ray emission (PIXE) measurements is describe
d. The system includes the following parts: a solution of the PIXE signal e
quation with respect to the beam profile function by the Fourier method and
a reconstruction of the elemental concentration distribution from a measur
ed signal by the method of successive substitutions. The results of applyin
g the developed program to the experimental distribution maps obtained from
a micro structured reference material are compared with the known properti
es of this reference material. (C) 2001 Elsevier Science B.V. All rights re
served.