Raman and photoluminescence spectroscopy from N-2(+)-ion implanted and alpha-irradiated and annealed GaN/sapphire

Citation
Hw. Kunert et al., Raman and photoluminescence spectroscopy from N-2(+)-ion implanted and alpha-irradiated and annealed GaN/sapphire, NUCL INST B, 181, 2001, pp. 286-292
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
181
Year of publication
2001
Pages
286 - 292
Database
ISI
SICI code
0168-583X(200107)181:<286:RAPSFN>2.0.ZU;2-D
Abstract
GaN on sapphire (SA) was both implanted by N-2(+) ions and alpha -particle irradiated from the GaN and substrate sides. Irradiation-induced vibration modes were observed in GaN. Raman spectra from the substrate reveal more dr astic changes. Photoluminescence spectroscopy shows a significant shift of the yellow band toward the higher energy. Annealing results in a good recov ery of GaN, while the substrate retains substantial structural damage. (C) 2001 Elsevier Science B.V. All rights reserved.