Characterization of room-temperature plastic deformation Of beta-Si3N4 by atomic force microscopy and transmission electron microscopy

Citation
X. Milhet et al., Characterization of room-temperature plastic deformation Of beta-Si3N4 by atomic force microscopy and transmission electron microscopy, PHIL MAG L, 81(9), 2001, pp. 623-629
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE LETTERS
ISSN journal
09500839 → ACNP
Volume
81
Issue
9
Year of publication
2001
Pages
623 - 629
Database
ISI
SICI code
0950-0839(200109)81:9<623:CORPDO>2.0.ZU;2-P
Abstract
Dislocation microstructures induced by room-temperature microhardness tests have been investigated in silicon nitride. Surface analysis of the residua l indent by atomic force microscopy reveals intragranular slip bands and de monstrates that room-temperature plastic deformation involves dislocation m otion as well as cross-slip events. Cross-slip events have been found to oc cur between (10(1) over bar 0) prismatic planes. Transmission electron micr oscopy shows that dislocations have a Burgers vector b = [0001] and are loc ated along the screw direction. Based on these observations, specific dislo cation core configurations are discussed.