Estimation of the latent track size of CR-39 using atomic force microscope

As a frame work of the study for the latent track size measurement using at omic force microscope, we have measured the minute etch pits and the extrem ely small amount of bulk etch of CR-39 at the beginning of chemical etching , and obtained its growth curves in nanometer dimensions. The pieces of CR- 39 were exposed to 6 MeV/n C and Fe ions with normal incidence angle and we re etched in 70 degreesC 7 N NaOH solution for 0.5,1,2,3,5 min. The diamete rs of latent track were estimated to be similar to 17 nm for Fe ions and si milar to 8 nm for C ions, respectively. These values are comparable to the experimental data on the average 'track core diameters' that have been obta ined by various experimental techniques. (C) 2001 Elsevier Science Ltd. All rights reserved.