The atomic force microscope as a fine tool for nuclear track studies

Authors
Vazquez-Lopez, C Fragoso, R Golzarri, JI Castillo-Mejia, F Fujii, M Espinosa, G
Citation
C. Vazquez-lopez et al., The atomic force microscope as a fine tool for nuclear track studies, RADIAT MEAS, 34(1-6), 2001, pp. 189-191
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
RADIATION MEASUREMENTS
ISSN journal
13504487 → ACNP
Volume
34
Issue
1-6
Year of publication
2001
Pages
189 - 191
Database
ISI
SICI code
1350-4487(200106)34:1-6<189:TAFMAA>2.0.ZU;2-8
Abstract
Atomic force microscopy (AFM) is a relatively new tool in the study of mate rials used in the nuclear track methodology. The sensitivity to detect ioni zing nuclear particles is strongly influenced by the surface roughness of t he material used as detector. In this contribution a surface analysis of se veral commercial polycarbonates used as nuclear track detectors is presente d. (C) 2001 Elsevier Science Ltd. All rights reserved.