The fractal properties of a geometric model of the high-resolution X-ray diffractor

Perfect and mosaic crystals are conventionally used in X-ray monochromators operating in the energy range from several hundred to tens of thousands of electronvolts. The focusing X-ray optics for nonparallel beams employs eit her cylindrical bent crystals (the methods of Johann [1], Johansson [2], an d Cauchois [3]) or crystals with spherical or toroidal [4] bending of the c rystallographic planes. Special variants of high-resolution stepped-crystal diffractors [5-8] were developed to study the possibility of high-precisio n focusing of a monochromatic X-ray radiation. The fractal properties of a geometric model of such a high-resolution stepped-crystal diffractor are co nsidered. (C) 2001 MAIK "Nauka/Interperiodica".