A Monte Carlo simulation model of the ion-assisted deposition process has b
een used in order to investigate the influence of some parameters on the fi
nal optical quality of the thin films. The simulations were performed on a
simple cubic lattice with the ballistic deposition of particles. The mechan
ism of internal rearrangements of deposited adatoms has been introduced int
o the model. The results show that the angle of the ion beam as well as the
kinetic energy of particles and ion-to-atom arrival ratio play an importan
t role in the quality of the deposited films. The influence of these parame
ters on morphology of the films has also been discussed. (C) 2001 Elsevier
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