Modified Airy function method for modeling of direct tunneling current in metal-oxide-semiconductor structures

Citation
J. Wang et al., Modified Airy function method for modeling of direct tunneling current in metal-oxide-semiconductor structures, APPL PHYS L, 79(12), 2001, pp. 1831-1833
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
12
Year of publication
2001
Pages
1831 - 1833
Database
ISI
SICI code
0003-6951(20010917)79:12<1831:MAFMFM>2.0.ZU;2-I
Abstract
Using a modified Airy function (MAF) to solve the Schrodinger equation in t he whole metaloxide-semiconductor structure, a fully quantum-mechanical mod el of direct tunneling current from an inverted p-Si substrate through ultr athin oxides is presented. The effects of tunneling on the electrostatic po tential and the distribution of electrons are also included when self-consi stently solving the Schrodinger and Poisson equations in silicon. Due to th e semianalytical nature of the MAF method, the model has Iii-h efficiency. Model results are compared with experimental data and show excellent agreem ent. Moreover, an approximately linear relationship between the logarithm o f the direct tunneling current and oxide thickness is found out. (C) 2001 A merican Institute of Physics.