Reconstructing x-ray fluorescence microtomograms

Authors
Citation
Cg. Schroer, Reconstructing x-ray fluorescence microtomograms, APPL PHYS L, 79(12), 2001, pp. 1912-1914
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
12
Year of publication
2001
Pages
1912 - 1914
Database
ISI
SICI code
0003-6951(20010917)79:12<1912:RXFM>2.0.ZU;2-T
Abstract
X-ray fluorescence microtomography allows one to map element distributions inside a sample with high sensitivity and resolutions in the micrometer ran ge. Quantitative reconstruction of the element concentrations from the fluo rescence data requires correction for the attenuation inside the sample. Ho wever, the attenuation of the fluorescence radiation is not directly access ible by experiment. The method described self-consistently estimates this a ttenuation and allows one to reconstruct relative concentrations. This is d emonstrated on numerical as well as experimental data. A measure for the qu ality of the reconstruction is given. (C) 2001 American Institute of Physic s.