Total electron emission from metals due to the impact of highly-charged Xeions with energies up to MeV

Total electron emission from metals due to the impact of multiply charged i ons, gamma, may significantly influence quantitative measurements of ion cu rrent in corpuscular diagnostics. The value of gamma (gamma /q) was determi ned for Xe ions impacting clean polycrystalline copper as a function of ion charge state (q = 6-28) and of ion kinetic energy, E-1/q = (5-150) keV/q, i.e. in the energy region up to E-1/A approximate to 30 keV/amu, where ther e is a lack of such data. For highly charged projectile ions, gamma was fou nd to have a clear minimum as a function of E-1. With decreasing charge sta te of the projectile ion this minimum shifts to a lower energy and becomes shallower, This observation is in agreement with compiled results of other authors. Limits for values of gamma /q are estimated and discussed.