Environmental-stress screening improves electronic-design reliability

Authors
Lakshminarayanan, V
Citation
V. Lakshminarayanan, Environmental-stress screening improves electronic-design reliability, EDN, 46(21), 2001, pp. 73
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
EDN
ISSN journal
00127515 → ACNP
Volume
46
Issue
21
Year of publication
2001
Database
ISI
SICI code
0012-7515(20010920)46:21<73:ESIER>2.0.ZU;2-U