SRAM transparent testing methodology using dynamic power supply current

A new transparent testing methodology using dynamic power supply current is proposed which is much simpler than traditional transparent testing algori thms. It employs the dynamic power supply current instead of making signatu res so that it does not need the extra steps and hardware to generate a sig nature. The paper describes how to convert a March algorithm to a transpare nt one and how to cover the fault models considered. The transformed algori thm is much simpler and test time can be greatly reduced. In addition, it c an detect extra faults that the original algorithm cannot. The whole BIST a rchitecture is described, together with anew peak current detector.