Stability characteristics of absorbing boundary conditions in microwave circuit simulations

Authors
Yu, WH Mittra, R Chakravarty, S
Citation
Wh. Yu et al., Stability characteristics of absorbing boundary conditions in microwave circuit simulations, IEEE ANTENN, 49(9), 2001, pp. 1347-1349
Citations number
4
Categorie Soggetti
Information Tecnology & Communication Systems
Journal title
IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION
ISSN journal
0018926X → ACNP
Volume
49
Issue
9
Year of publication
2001
Pages
1347 - 1349
Database
ISI
SICI code
0018-926X(200109)49:9<1347:SCOABC>2.0.ZU;2-1
Abstract
In this paper, we examine the stability properties of several absorbing bou ndary conditions in the finite-difference time-domain (FDTD) simulations of microwave circuits. The numerical experiments show that the stability char acteristics of absorbing boundary conditions, e.g., MURss and perfectly mat ched layers (PML), can depend upon the discretization of the computational domain.