Modelling studies of amorphous In-Se films

The wide-angle X-ray scattering studies on amorphous In-Se films with selen ium content of 60 and 66 at.% are reported. The intensities were recorded i n the scattering vector range between 0.3 and 16 Angstrom (-1). The intensi ty functions have been simulated using the Debye relationship for a series of models based on structures of crystalline counter-parts. The best agreem ent with the experimental data has been achieved for the In-Se structure. i n which In and Se are tetrahedrally and three-fold coordinated. respectivel y. (C) 2001 Elsevier Science B.V. All rights reserved.