Alloying effects in near-eutectic Sn-Ag-Cu solder alloys for improved microstructural stability

Citation
Ie. Anderson et al., Alloying effects in near-eutectic Sn-Ag-Cu solder alloys for improved microstructural stability, J ELEC MAT, 30(9), 2001, pp. 1050-1059
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
30
Issue
9
Year of publication
2001
Pages
1050 - 1059
Database
ISI
SICI code
0361-5235(200109)30:9<1050:AEINSS>2.0.ZU;2-U
Abstract
This study included a comparison of the baseline Sn-3.5Ag eutectic to one n ear-eutectic ternary alloy, Sn-3.6Ag-1.0Cu and two quaternary alloys, Sn-3. 6Ag-1.0Cu-0.15Co and Sn-3.6Ag-1.0Cu-0.45Co, to increase understanding of th e beneficial effects of Co on Sn-Ag-Cu solder joints cooled at 1-3 degreesC /sec, typical of reflow practice. The results indicated that joint microstr ucture refinement is due to Co-enhanced nucleation of the Cu6Sn5 phase in t he solder matrix, as suggested by Auger elemental mapping and calorimetric measurements. The Co also reduced intermetallic interface faceting and impr oved the ability of the solder joint samples to maintain their shear streng th after aging for 72 hr at 150 degreesC. The baseline Sn-3.5Ag joints exhi bited significantly reduced strength and coarser microstructures.