We present a theoretical study on the behavior of confined exciton energies
of single 3C-, 4H-, and 6H-SiC/SiO2 quantum wells and wires within an abru
pt/nonabrupt interface picture. We find that differences between exciton en
ergies in abrupt quantum wells and wires are very significant (up to simila
r to 150 meV), depending on the polytype and the thickness of the nonabrupt
, SiC/SiO2 interfaces. The exciton blueshift due to a 5 Angstrom wide nonab
rupt interface is very strong (up to similar to 120 meV).