Ring oscillator using an RTD-HBT heterostructure

Citation
Ch. Lin et al., Ring oscillator using an RTD-HBT heterostructure, J KOR PHYS, 39(3), 2001, pp. 572-575
Citations number
2
Categorie Soggetti
Physics
Journal title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN journal
03744884 → ACNP
Volume
39
Issue
3
Year of publication
2001
Pages
572 - 575
Database
ISI
SICI code
0374-4884(200109)39:3<572:ROUARH>2.0.ZU;2-4
Abstract
We report the first ring oscillator design using a Resonant Tunneling Diode -Heterojunction Bipolar Transistor (RTD-HBT) heterostructure for high-speed and low-power applications. The ring oscillator consists of three-stage RT D-HBT inverters using 2 x 5 mum(2) HBT technology. The center oscillation f requency of the oscillator is 17.32 GHz and it consumes only 2.3 mW from a 1.3-V power supply. The phase noise is -88.8 dBc/Hz at a 1 MHz offset and - 95.2 dBc/Hz at a 10 MHz offset under the above-mentioned bias condition. Ri ng oscillators have been widely employed in phase-locked loops for clock an d data recovery and in frequency synthesis in communication systems because they are easy to design and very reliable. With CMOS technology, the oscil lation frequency is limited to the sub-GigaHertz to GigaHertz range due to the low speed of CMOS. With RTD-HBT technology, we are able to design and f abricate ring oscillators operating at higher speeds with lower power consu mption.