Morphology of thin lead films grown on glass substrates by atomic force and electron microscopy

The morphology of vacuum evaporated lead films (similar to 50-200 Angstrom) on glass substrates has been investigated by atomic force microscopy and t ransmission electron microscopy with selected area diffraction. It is obser ved that the grain size increases with film thickness. When the thickness e xceeds a certain value, the grains coalesce to form clusters. The size and roughness have been investigated by atomic force microscopy. The selected a rea diffraction pattern show polycrystalline nature of the films even at 60 Angstrom thickness. The transmission electron microscopy shows isolated gr ains at lower thickness which agglomerate at higher thickness. (C) 2001 Els evier Science B.V. All rights reserved.