Electropolishing of Bi2Te3 based alloys

Polarography has been used as a tool for controlling the electropolishing o f p-type Bi0.5Sb1.5Te3.0 and n-type Bi2Se0.3Te2.7:0.2 wt.% SbI3 semiconduct ing materials used in thermoelectric coolers at particular current density in terms of electropolished film thickness preceded by the electroetching o f these materials in suitable electrolytes, by measuring the diffusion curr ent for the reduction of Sb and Se ions at dropping mercury electrode (DME) from electropolishing electrolytes for the p-type and n-type materials res pectively. In addition, I-V measurements for correlating the current densit y with the growth of the electropolished film for these n-type and p-type s emiconductors have been carried out. (C) 2001 Elsevier Science B.V. All rig hts reserved.