The formation of PtSi ultra-thin films prepared by pulsed laser deposition
during pulsed laser annealing has been studied. The growth sequence of the
Pt2Si and the PtSi phases that evolved as the result of the diffusion react
ion in the bilayers was examined by X-ray photoelectron spectroscopy (XPS)
and the structure characteristics of PtSi were investigated by XPS. X-ray d
iffraction (XRD) and atomic force microscopy (AFM). Superb uniformity of Pt
Si films and smooth PtSi/Si interfaces were obtained by pulsed laser anneal
ing. (C) 2001 Elsevier Science BN. All rights reserved.