Current trend to miniaturization requires precise control of micro- and dom
ain structure of ferroelectric materials at the nanoscale level. This is es
sential for future applications of ferroelectric thin films in non-volatile
memories, microactuators and pyroelectric arrays. In this work, the seedin
g effect on the nanoscale properties of ferroelectric Pb(Zr,T)O-3 (PZT) thi
n films is investigated using scanning force microscopy (SFM) capable of si
multaneously resolving topographic and domain features on the surface of th
e films. It is shown that the addition of 5 mol% seeds (fine PZT powder) in
to the sol-gel precursor solution completely modifies the film's microstruc
ture leading to the improved morphology of the grains, reduced roughness an
d smaller microporosity. At the same time, significant imprint and instabil
ity of the written domain pattern is reduced due to the smaller influence o
f the bottom electrode interface. (C) 2001 Elsevier Science B.V. All rights
reserved.