R-curve characterization of the fracture toughness of nanocrystalline nickel thin sheets

Authors
Mirshams, RA Mao, CH Whang, SH Yin, WM
Citation
Ra. Mirshams et al., R-curve characterization of the fracture toughness of nanocrystalline nickel thin sheets, MAT SCI E A, 315(1-2), 2001, pp. 21-27
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
315
Issue
1-2
Year of publication
2001
Pages
21 - 27
Database
ISI
SICI code
0921-5093(20010930)315:1-2<21:RCOTFT>2.0.ZU;2-3
Abstract
The fracture resistance curves of nanocrystalline nickel and carbon doped n anocrystalline nickel for different annealing temperatures have been genera ted and studied. The results indicate that crack growth resistance of pure nanocrystalline nickel is very sensitive to annealing temperatures. The cra ck growth resistance decreased with increasing annealing temperature for th e nanocrystalline nickel. Carbon doping greatly reduces crack growth resist ance of nanocrystalline nickel. However, the crack growth resistance of car bon-doped nanocrystalline shows improvement through annealing processing. A cluster model was used to explain the crack growth resistance behavior of nanocrystalline nickel. (C) 2001 Elsevier Science B.V. All rights reserved.