We report on the fabrication by electron-beam lithography of Bragg gratings
, which serve as wavelength-selective elements of a Mach-Zehnder-type add-d
rop filter. To meet telecommunication network requirements, the gratings mu
st have about 20 000 lines, corresponding to a length on the order of 10 mm
. Furthermore, the coupling strength of the gratings has to be varied accor
ding to a bell-shaped taper function to suppress unwanted side lobes in the
gratings' reflection spectra. We have realised coupling coefficient variat
ion at constant etch depth by changing the duty cycle along the grating. Th
e employed pattern reversal process provides good line-width control of the
grating ridges down to 50 nm, and good coverage by the subsequent PECVD ov
ergrowth. Optical measurements are presented that demonstrate the excellent
performance of the grating couplers. (C) 2001 Elsevier Science BY All righ
ts reserved.