Lithographically defined polymer tips for quartz tuning fork based scanning force microscopes

Citation
T. Akiyama et al., Lithographically defined polymer tips for quartz tuning fork based scanning force microscopes, MICROEL ENG, 57-8, 2001, pp. 769-773
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
57-8
Year of publication
2001
Pages
769 - 773
Database
ISI
SICI code
0167-9317(200109)57-8:<769:LDPTFQ>2.0.ZU;2-5
Abstract
A process for batch fabricating and mounting polymer (SU-8, EPON) tips on a mass-produced quartz tuning fork wafer is proposed in this paper. In order to add a sharp tip to a side wall of such tuning forks, three unconvention al procedures were combined with an optical lithography step: (1) gluing th e sample and mask together; (2) coating a photosensitive polymer directly o n this ensemble; and (3) inclining the mask during exposure. Sharp SU-8 tip s with a 170 nm radius of curvature were obtained. These tuning fork sensor s were successfully applied in scanning force microscope imaging in the dyn amic mode. (C) 2001 Elsevier Science BY All rights reserved.