Micromachined silicon suspended wires with submicrometric dimensions

Citation
P. Bruschi et al., Micromachined silicon suspended wires with submicrometric dimensions, MICROEL ENG, 57-8, 2001, pp. 959-965
Citations number
11
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
57-8
Year of publication
2001
Pages
959 - 965
Database
ISI
SICI code
0167-9317(200109)57-8:<959:MSSWWS>2.0.ZU;2-#
Abstract
Silicon suspended wires with a cross section of about 0.25 mum(2) have been fabricated by means of a simple process, starting from a SOI n-type wafer. Standard lithography, isotropic and anisotropic etchings were used. The pr ocess requires only two masks with a minimum dimension of 4 mum. After the definition of the suspended structures a further oxidation step was perform ed in order to reduce the silicon core dimensions. Particular care was devo ted to the rinsing step to avoid any sticking problem to the substrate. (C) 2001 Elsevier Science BY. All rights reserved.