Bias correction and yield optimization of MMICs with external digital control

Authors
Scotti, G Tommasino, P Trifiletti, A
Citation
G. Scotti et al., Bias correction and yield optimization of MMICs with external digital control, MICROW OPT, 31(2), 2001, pp. 134-137
Citations number
13
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
31
Issue
2
Year of publication
2001
Pages
134 - 137
Database
ISI
SICI code
0895-2477(20011020)31:2<134:BCAYOO>2.0.ZU;2-N
Abstract
A new methodology for yield optimization of integrated circuits is presente d. We propose a do external control scheme which performs on-line estimatio n of the active device model parameters and proper correction of the bias p oint. Design of a 2.5 Gbit / s front-end amplifier has been performed, and a strong yield improvement has been found. (C) 2001 John Wiley & Sons, Inc.