Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8

Authors
Kagoshima, Y Takai, K Ibuki, T Yokoyama, Y Hashida, T Yokoyama, K Takeda, S Urakawa, M Miyamoto, N Tsusaka, Y Matsui, J Aino, M
Citation
Y. Kagoshima et al., Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8, NUCL INST A, 467, 2001, pp. 872-876
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
872 - 876
Database
ISI
SICI code
0168-9002(20010721)467:<872:SHXMWT>2.0.ZU;2-A
Abstract
A scanning hard X-ray microscope using a phase zone plate made of tantalum as its X-ray focusing device is in operation at the Hyogo-BL (BL24XU) of SP ring-8. The X-ray microbeam has a size of 0.8 mum x 0.7 mum at the photon e nergy of 10 keV, which can make visible structures as fine as 250-nm line-a nd-space pattern. The photon flux density at the sample position is similar to 2 x 10(9) phs/s/mum(2) and the gain of the phase zone plate is similar to 3000. The minimum detection limits irradiated by the microbeam are evalu ated to be around 10 ppm for some trace elements contained in standard refe rence materials of glass matrices. X-ray images obtained so far demonstrate a high feasibility of the microscope. (C) 2001 Elsevier Science B.V. All r ights reserved.