Development of a compact beam intensity monitor for micro X-ray absorptionfine structure measurements

Authors
Hayakawa, S Suzuki, M Oshima, M Hirokawa, T
Citation
S. Hayakawa et al., Development of a compact beam intensity monitor for micro X-ray absorptionfine structure measurements, NUCL INST A, 467, 2001, pp. 901-904
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
901 - 904
Database
ISI
SICI code
0168-9002(20010721)467:<901:DOACBI>2.0.ZU;2-L
Abstract
A compact beam intensity monitor detecting an X-ray excited sample current from a thin metal foil was developed for micro X-ray absorption fine struct ure (XAFS) measurements. By utilizing gas amplification caused by the eject ed photoelectrons or Auger electrons, the monitor can achieve better sensit ivity than what can be realized with the ionization chamber. Fluctuation of the beam intensity through the pinhole of 10 mum was precisely measured by using this monitor, and the XAFS spectrum from a Ni thin foil was successf ully measured with adequate normalization. (C) 2001 Elsevier Science B.V. A ll rights reserved.