Submicron X-ray diffraction

Citation
Aa. Macdowell et al., Submicron X-ray diffraction, NUCL INST A, 467, 2001, pp. 936-943
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
936 - 943
Database
ISI
SICI code
0168-9002(20010721)467:<936:SXD>2.0.ZU;2-Q
Abstract
At the Advanced Light Source in Berkeley we have instrumented a beam line t hat is devoted exclusively to X-ray micro-diffraction problems. By micro-di ffraction we mean those classes of problems in Physics and Materials Scienc e that require X-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron-siz ed aluminum metal grains buried under a silicon dioxide insulating layer. T he resulting Laue pattern is collected on a large area CCD detector and aut omatically indexed to yield the grain orientation and deviatoric (distortio nal) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam. which allows monochromatic light to illumin ate the same part of the sample. Measurement of the diffracted photon energ y allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total st rain/stress tensor (6 components) inside each sub-micron-sized illuminated volume of the sample. (C) 2001 Elsevier Science B.V. All rights reserved.