X-ray microbeam with sputtered-sliced Fresnel zone plate at SPring-8 undulator beamline

Authors
Suzuki, Y Awaji, M Kohmura, Y Takeuchi, A Takano, H Kamijo, N Tamura, S Yasumoto, M Handa, K
Citation
Y. Suzuki et al., X-ray microbeam with sputtered-sliced Fresnel zone plate at SPring-8 undulator beamline, NUCL INST A, 467, 2001, pp. 951-953
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
951 - 953
Database
ISI
SICI code
0168-9002(20010721)467:<951:XMWSFZ>2.0.ZU;2-F
Abstract
A hard X-ray microbeam created from a sputtered-sliced Fresnel zone plate h as been tested at SPring-8 undulator beamline. Focusing properties are eval uated in the X-ray wavelength regions of 0.15-1.5 Angstrom The measured foc al beam size is about 0.6 mum at an X-ray wavelength of 1.4 Angstrom. In a scanning microscopy experiment, resolution-test-patterns with 0.2 mum struc ture are resolved at an X-ray wavelength of 0.45 Angstrom. (C) 2001 Elsevie r Science B.V. All rights reserved.