Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals

Citation
Y. Takahashi et al., Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals, NUCL INST A, 467, 2001, pp. 1001-1004
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
1001 - 1004
Database
ISI
SICI code
0168-9002(20010721)467:<1001:TRXMMO>2.0.ZU;2-#
Abstract
The time-resolved synchrotron X-ray microbeam diffraction experiment has be en carried out to reveal the local layer response to the electric field in the antiferroelectric liquid crystal. The X-ray microbeam of a few mum spat ial resolution was obtained with Kirkpatrick-Baez optics. The time-resolved small angle diffraction experiment was performed with a time resolution ra nging from 10 mus to a few ms. The reversible local layer change between th e horizontal chevron and the quasi-bookshelf structure was confirmed by the triangular wave form. The transient layer response for the step form elect ric field was observed. The layer response closely related with an electric field induced antiferroelectric to ferroelectric phase transition. (C) 200 1 Elsevier Science B.V. All rights reserved.