Portable high precision small/wide angle X-ray scattering diffractometer

The portable high precision small/wide angle X-ray scattering diffractomete r (modified Bonze-Hart optical scheme) was designed and developed for the i nvestigation of structure rearrangement during liquid state-solid state tra nsformations (with reaction time of 10 h or more) for the investigation of the process of solid state phase formation. The FEM detectors are used as m onitor and detector. The double crystal Si I I I analyzer (with changeable relative angle of the second crystal) is used as analyzer. All controlling electronics are designed in CAMAC. The diffractometer is controlled by a Su n SPARCStation with SVIC/VCC modules under a Solaris 2.4 operating system, and allows one to obtain the SAXS curves with accuracies (on s-vector for p hoton energy 8 keV) of about deltas similar to0.002nm (1), s(min) similar t o0.005 nm(-1) (scattering centers with the size of about 200-500 nm may be observed) and s(max) similar to 50 nm(-1) (scattering angle is about 80 deg rees). (C) 2001 Elsevier Science B.V. All rights reserved.