There has been a recent rapid increase in interest in the measurement of so
ft X-ray magnetic scattering (SoXMaS) to characterize the distribution of m
agnetic moments in thin films and multilayers. The Daresbury Laboratory tea
m has adapted a high-vacuum two-circle diffractometer for pioneering measur
ements in this field, The principal features of the diffractometer and the
alignment procedure for SoXMaS measurements are presented. A flexible data
acquisition system is used, which allows a wide variety of scan modes and c
ontrol of the various beamlines on which the experiments have been performe
d. (C) 2001 Elsevier Science B.V. All rights reserved.