Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications

Authors
Kappen, P Troger, L Hansen, K Reckleben, C Lechner, P Strssuder, L Materlik, G
Citation
P. Kappen et al., Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications, NUCL INST A, 467, 2001, pp. 1163-1166
Citations number
5
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
1163 - 1166
Database
ISI
SICI code
0168-9002(20010721)467:<1163:SCOMMS>2.0.ZU;2-L
Abstract
Spatially resolved spectroscopic measurements with a 10 and 20 mum pencil b eam have been performed on a monolithic 7-element Silicon-Drift-Detector (S DD). Detailed studies are shown of the modification of the spectroscopic re sponse at pixel edges and pixel centre. The results give quantitative insig ht into the local SDD performance. A simple model predicts global propertie s (e.g. peak-to-background ratio) of larger SDD arrays, like the 61-element detector currently under development. (C) 2001 Elsevier Science B.V. All r ights reserved.