A new set-up for X-ray micro-diffraction has been developed on the ESRF bea
mline ID22. It allows microscopic characterization of materials with microm
eter resolution. This facilitates the measurement of material quantities as
average size of the coherently diffracting volume, local dislocation densi
ty, residual stress, local fluctuation of the residual stress, and intragra
nular misorientation from single grains of a polycrystalline material. The
first application on an IF-Ti steel after different thermo-mechanical treat
ments is presented, (C), 2001 Elsevier Science B.V. All rights reserved.