The application of white radiation to residual stress analysis in the intermediate zone between surface and volume

Mechanical surface processing is known to give rise to complex residual str ess fields in the near surface region of polycrystalline materials. Consequ ently. their analysis by means of non-destructive X-ray and neutron diffrac tion methods has become an important topic in materials science. However, t here remains a gap with respect to the accessible near surface zone, which concerns a range between about 10 mum and I mm, where the conventional X-ra y methods are no longer and the neutron methods are not yet sensitive. In o rder to achieve the necessary penetration depth tau to perform residual str ess analysis (RSA) in this region. advantageous use can be made of energy d ispersive Xray diffraction of synchrotron radiation (15-60 keV) in the refl ection mode. Besides an example concerning the adaptation of methods applie d so far in the angle dispersive RSA to the energy dispersive case, the con cept of a new materials science beamline at BESSY II for residual stress an d texture analysis is presented. (C) 2001 Elsevier Science B.V All rights r eserved.