Measurement of synchrotron pulse durations using surface photovoltage transients

Authors
Glover, TE Ackermann, GD Belkacem, A Feinberg, B Heimann, PA Hussain, Z Padmore, HA Ray, C Schoenlein, RW Steele, WF
Citation
Te. Glover et al., Measurement of synchrotron pulse durations using surface photovoltage transients, NUCL INST A, 467, 2001, pp. 1438-1440
Citations number
3
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
1438 - 1440
Database
ISI
SICI code
0168-9002(20010721)467:<1438:MOSPDU>2.0.ZU;2-J
Abstract
We report results on experiments using combined laser and synchrotron radia tion. Picosecond laser pulses at 800 nm are used to induce surface photovol tage transients in p-type Si samples. A two-component decay is observed. Th e fast component of decay provides a direct measure of synchrotron soft X-r ay pulse durations. (C) 2001 Elsevier Science B.V. All rights reserved.