Performance of soft X-ray emission spectrometer employing charge-coupled device detector

Authors
Sasaki, TA Chugan, N Muramatsu, Y
Citation
Ta. Sasaki et al., Performance of soft X-ray emission spectrometer employing charge-coupled device detector, NUCL INST A, 467, 2001, pp. 1489-1492
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
1489 - 1492
Database
ISI
SICI code
0168-9002(20010721)467:<1489:POSXES>2.0.ZU;2-I
Abstract
The performance of a soft X-ray emission spectrometer employing a charge-co upled device camera was examined in the energy range of 80-1250 eV. The spe ctra observed by low-energy electron irradiation for metal L, oxygen K and silicon L lines were in good agreement with the previous observations by co nventional MCP detectors. The results suggest that the energy resolution is good enough for the resonant excitation spectroscopy by synchrotron radiat ion as well. (C) 2001 Elsevier Science B.V. All rights reserved.