Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements

A new type of Compton spectrometer is introduced for use at energies of 100 keV. Synchrotron radiation beam of a well-defined energy gradient is refle cted on the sample by a cylindrically bent Laue-type monochromator, and the scattered radiation is analyzed by another bent Laue-type crystal. It is s hown that nearly exact dispersion compensation is achieved over the entire energy spectrum. Due to the increased reflecting power of asymmetrically cu t bent crystals the average count rate of Compton scattering is of the orde r of 10(4) CPS, while the momentum resolution of the spectrometer is 0.1 a. u. or better. Results of the first test measurements are presented. (C) 200 1 Elsevier Science B.V. All rights reserved.