An inelastic X-ray spectrometer with 2.2 meV energy resolution

Authors
Sinn, H Alp, EE Alatas, A Barraza, J Bortel, G Burkel, E Shu, D Sturhahn, W Sutter, JP Toellner, TS Zhao, J
Citation
H. Sinn et al., An inelastic X-ray spectrometer with 2.2 meV energy resolution, NUCL INST A, 467, 2001, pp. 1545-1548
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
2
Pages
1545 - 1548
Database
ISI
SICI code
0168-9002(20010721)467:<1545:AIXSW2>2.0.ZU;2-P
Abstract
We present a new spectrometer at the Advanced Photon Source for inelastic X -ray scattering with an energy resolution of 2.2 meV at an incident energy of 21.6 keV. For monochromatization, a nested structure or one silicon chan nel cut and one 'artificial' channel cut is used in forward-scattering geom etry. The energy analysis is achieved by a two-dimensional focusing silicon analyzer in backscattering geometry. In the first demonstration experiment s, elastic scattering from a Plexiglas (TM) sample and two dispersion curve s in a beryllium single crystal were measured. Based on these data sets, th e performance of the new spectrometer is discussed. Published by Elsevier S cience B.V.