Spectroscopic ellipsometry characterization of Er3+-doped titania thin films prepared by the sol-gel method

Titania thin films prepared by the sol-gel method were optically characteri zed by spectroscopic ellipsometry. These films were doped with Er3+ and sup ported on silicon wafers chemically activated by using the, dipping method. The dielectric function was modeled using the Forouhi-Bloomer model, which provides also the refractive index and the thickness of the film.