Si. Golubov et al., On recoil-energy-dependent defect accumulation in pure copper - Part II. Theoretical treatment, PHIL MAG A, 81(10), 2001, pp. 2533-2552
Over the years, an enormous amount of experimental results have been report
ed on damage accumulation (e.g. void swelling) in metals and alloys irradia
ted under vastly different recoil energy conditions. Unfortunately, however
, very little is known either experimentally or theoretically about the eff
ect of recoil energy on damage accumulation. Recently, dedicated irradiatio
n experiments using 2.5 MeV electrons, 3.0 MeV protons and fission neutrons
have been carried out to determine the effect of recoil energy on the dama
ge accumulation behaviour in pure copper and the results have been reported
in part I of this paper (Singh et al., 2001, Phil. Mag. A, 80, 2629). The
present paper attempts to provide a theoretical framework within which the
effect of recoil energy on damage accumulation behaviour can be understood.
The damage accumulation under Frenkel pair production (e.g. 2.5 MeV electr
on) has been treated in terms of the standard rate theory (SRT) model where
as the evolution of the defect microstructure under cascade damage conditio
ns (e.g. 3.0 MeV protons and fission neutrons) has been calculated within t
he framework of the production bias model (PBM). Theoretical results, in ag
reement with experimental results, show that the damage accumulation behavi
our is very sensitive to the recoil energy and under cascade damage conditi
ons can be treated only within the framework of the PBM. The intracascade c
lustering of self-interstitial atoms (SIAs) and the properties of SIA clust
ers such as one-dimensional diffusional transport and thermal stability are
found to be the main reasons for the recoil-energy-dependent vacancy super
saturation. The vacancy supersaturation is the main driving force for the v
oid nucleation and void swelling. In the case of Frenkel pair production, t
he experimental results are found to be consistent with the SRT model with
a dislocation bias value of 2%.