Binary separation in very thin nematic films: Thickness and phase coexistence - art. no. 125701

Citation
D. Van Effenterre et al., Binary separation in very thin nematic films: Thickness and phase coexistence - art. no. 125701, PHYS REV L, 8712(12), 2001, pp. 5701
Citations number
19
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
8712
Issue
12
Year of publication
2001
Database
ISI
SICI code
0031-9007(20010917)8712:12<5701:BSIVTN>2.0.ZU;2-6
Abstract
The behavior as a function of temperature of very thin films (10 to 200 nm) of pentylcyanobiphenyl on silicon substrates is reported. In the vicinity of the nematic-isotropic. transition we observe a coexistence of two region s of different thicknesses: thick regions are in the nematic state while th in ones are in the isotropic state. Moreover, the transition temperature is shifted downward following a 1/h(2) law (h is the film thickness). Microsc ope observations and small-angle x-ray scattering allowed us to draw a phas e diagram which is explained in terms of a binary first-order phase transit ion where thickness plays the role of an order parameter.