Extending laser diffraction for particle shape characterization: technicalaspects and application

Extending the laser diffraction technique to measurement of both particle s ize and shape is quite an interesting topic, especially for on-line process control and monitoring. It is possible as the scattering pattern of partic les contains both types of information. This article describes the applicat ion of a novel sensor with two-dimensional pixel arrays for obtaining parti cle shape information. The fluctuating scattered light intensities in the a zimuthal directions are transformed via cross-correlation into Particle Ang le Spectra, which reflect the shape information. Possibilities for improvem ent of this information by using single-sweep analysis, small numbers of pa rticles in the measurement zone, principal component analysis and Fourier a nalysis are discussed. Its potential for application is demonstrated by mon itoring the shape change of cubic crystals during attrition. (C) 2001 Elsev ier Science B.V. All rights reserved.