Reactive magnetron sputtering of tin-doped indium oxide (ITO): influence of argon pressure and plasma excitation mode

Citation
R. Mientus et K. Ellmer, Reactive magnetron sputtering of tin-doped indium oxide (ITO): influence of argon pressure and plasma excitation mode, SURF COAT, 142, 2001, pp. 748-754
Citations number
24
Categorie Soggetti
Material Science & Engineering
Journal title
SURFACE & COATINGS TECHNOLOGY
ISSN journal
02578972 → ACNP
Volume
142
Year of publication
2001
Pages
748 - 754
Database
ISI
SICI code
0257-8972(200107)142:<748:RMSOTI>2.0.ZU;2-3
Abstract
Tin-doped indium oxide (ITO) films have been prepared by reactive magnetron sputtering from it metallic alloy target onto unheated substrates. In a sy stematic study, the influence of the working pressure and the discharge mod e (DC, Pulsed DC or RF) on the electrical and structural properties of ITO films was investigated. It was found that the RF excitation (13.56 MHz) of a magnetron discharge is the most effective one with respect to the usage o f the oxygen for oxidising the sputtered metal atoms on the substrate surfa ce. When varying the working pressure (0.3-3.4 Pa), the oxygen partial pres sure for the resistivity minimum of the ITO films is independent of the wor king pressure for RF excitation. Exciting the plasma by DC, an increasing o xygen amount is necessary in order to prepare low resistant ITO films when increasing the working pressures. This behaviour can be explained by differ ent sources for the input of energetic particles into the growing film for RF and DC excitation. In a DC discharge, most of the energetic particles st em from the target surface (e.g. reflected neutral argon atoms or negative oxygen ions), while in a RF magnetron discharge, the largest part of the en ergetic particles has its origin in the plasma in front of the substrate. B y Rutherford backscattering analysis the chemical composition of the ITO fi lms as a function of the oxygen partial pressure was investigated. Fully ox idised ITO films exhibit an oxygen excess of approximately 15%. Low resista nt ITO films show an oxygen-to-metal ratio of approximately 1.5, suggesting a film structure where the tin atoms occupy indium lattice sites. From the XRD analysis, a compressive strain in the ITO films of up to 2% was measur ed, which seems to be caused by the excess oxygen in the films. Furthermore , the ITO films exhibit a density which is up to Mlo lower than that of bul k indium oxide. (C) 2001 Elsevier Science BN. All rights reserved.