R. Mientus et K. Ellmer, Reactive magnetron sputtering of tin-doped indium oxide (ITO): influence of argon pressure and plasma excitation mode, SURF COAT, 142, 2001, pp. 748-754
Tin-doped indium oxide (ITO) films have been prepared by reactive magnetron
sputtering from it metallic alloy target onto unheated substrates. In a sy
stematic study, the influence of the working pressure and the discharge mod
e (DC, Pulsed DC or RF) on the electrical and structural properties of ITO
films was investigated. It was found that the RF excitation (13.56 MHz) of
a magnetron discharge is the most effective one with respect to the usage o
f the oxygen for oxidising the sputtered metal atoms on the substrate surfa
ce. When varying the working pressure (0.3-3.4 Pa), the oxygen partial pres
sure for the resistivity minimum of the ITO films is independent of the wor
king pressure for RF excitation. Exciting the plasma by DC, an increasing o
xygen amount is necessary in order to prepare low resistant ITO films when
increasing the working pressures. This behaviour can be explained by differ
ent sources for the input of energetic particles into the growing film for
RF and DC excitation. In a DC discharge, most of the energetic particles st
em from the target surface (e.g. reflected neutral argon atoms or negative
oxygen ions), while in a RF magnetron discharge, the largest part of the en
ergetic particles has its origin in the plasma in front of the substrate. B
y Rutherford backscattering analysis the chemical composition of the ITO fi
lms as a function of the oxygen partial pressure was investigated. Fully ox
idised ITO films exhibit an oxygen excess of approximately 15%. Low resista
nt ITO films show an oxygen-to-metal ratio of approximately 1.5, suggesting
a film structure where the tin atoms occupy indium lattice sites. From the
XRD analysis, a compressive strain in the ITO films of up to 2% was measur
ed, which seems to be caused by the excess oxygen in the films. Furthermore
, the ITO films exhibit a density which is up to Mlo lower than that of bul
k indium oxide. (C) 2001 Elsevier Science BN. All rights reserved.