Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, beta and attenuation lengths

Citation
Mp. Seah et Is. Gilmore, Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, beta and attenuation lengths, SURF INT AN, 31(9), 2001, pp. 835-846
Citations number
26
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
31
Issue
9
Year of publication
2001
Pages
835 - 846
Database
ISI
SICI code
0142-2421(200109)31:9<835:SEFCPF>2.0.ZU;2-U
Abstract
In this work we develop simple equations, suitable for the analyst, based o n the Monte Carlo calculations of Jablonski, for the corrections arising fr om elastic scattering. These concern modification of the angular anisotropy in XPS and the absolute intensities in both Auger electron spectroscopy (A ES) and x-ray photoelectron spectroscopy (XPS) as a function of the atomic number Z. We also derive more accurate equations for these parameters and t he ratio of the attenuation length, L, to the inelastic mean free path (IMF P) based on a knowledge of omega, where omega is the ratio of the IMFP to t he sum of the transport mean free path (TrMFP) and the IMFP. The first equations give the corrections to the anisotropy, beta (eff)(alph a)/beta, and the total emission, Q(alpha), from Jablonski's work in terms o f a total of four equations and a total of 19 coefficients to replace Jablo nski's two equations with a total of 2376 coefficients. The present equatio ns describe the dependencies of beta (eff)(alpha)/beta and Q(a) on the angl e of electron emission a, the electron energy E and the atomic number of th e matrix in the ranges 0 degrees < alpha < 70 degrees, 300 < E < 1500 eV an d 6 < Z < 83. The standard deviation of the scatter with regard to Jablonsk i's calculations are 4.6% for beta (eff)(alpha)/beta and 1.35% for Q(alpha) , giving an overall uncertainty for quantification, relative to the Monte C arlo calculations, of better than 2%. The equations allow values of beta (e ff)(alpha) to be calculated for revised values of beta and for elements oth er than the 27 studied by Jablonski. They also allow Q(a) to be calculated for other elements and for energies appropriate to Auger electrons within t he above ranges. More complex equations, derived from a slight modification to the transport equations, allow beta (eff)(0)/beta, Q(0) and the ratio L/IMFP to be deriv ed from a knowledge of w. These equations exhibit a standard deviation of s catter of 2.8%, 0.3% and 1.1%, respectively, compared with the Monte Carlo calculations of Jablonski and of Cumpson and Seah, leading to uncertainties in quantification of the order of 1%. These equations are more complex for the analyst to use than the simple equations as a function of Z, but have superior accuracies and accuracies that are probably limited by the precisi on of the Monte Carlo calculations. (C) Crown Copyright 2001. Reproduced by permission of the Controller of HMSO. Published by John Wiley & Sons, Ltd.