Ultrathin film growth and spectroscopic characterization of VOx (0.8 <= x <= 1.3) on Pt(111)

Citation
M. Petukhov et al., Ultrathin film growth and spectroscopic characterization of VOx (0.8 <= x <= 1.3) on Pt(111), SURF SCI, 490(3), 2001, pp. 376-384
Citations number
32
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
490
Issue
3
Year of publication
2001
Pages
376 - 384
Database
ISI
SICI code
0039-6028(20010910)490:3<376:UFGASC>2.0.ZU;2-8
Abstract
VOx ultrathin epitaxial films (0.8 less than or equal to x less than or equ al to 1.3) have been grown on Pt(1 1 1) by evaporating vanadium in a low an d well-controlled water background (1 x 10(-7) Pa). X-ray photoelectron spe ctroscopy, ultraviolet photoelectron spectroscopy and X-ray excited auger e lectron spectroscopy data strongly indicate that vanadium(II) in the predom inant oxidation state. Angle-scanned photoelectron diffraction data are com patible with a single domain film, bearing a rock-salt VO structure and exp osing the (1 1 1) plane. Such films evolve toward more oxidized species wit hin hours, probably due to oxidation by residual water in the chamber. (C) 2001 Elsevier Science B.V. All rights reserved.