Chip-based refractive index detection using a single point evanescent waveprobe

Citation
Sc. Jakeway et Aj. De Mello, Chip-based refractive index detection using a single point evanescent waveprobe, ANALYST, 126(9), 2001, pp. 1505-1510
Citations number
30
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYST
ISSN journal
00032654 → ACNP
Volume
126
Issue
9
Year of publication
2001
Pages
1505 - 1510
Database
ISI
SICI code
0003-2654(200109)126:9<1505:CRIDUA>2.0.ZU;2-C
Abstract
This paper presents a novel approach for performing spectroscopic refractiv e index detection within microfluidic channel environments. Based on the pr inciple of total internal reflection (TIR), changes in the refractive index of an analyte stream passing through a microfabricated channel are detecte d through interaction with an optical evanescent field formed at the channe l wall. Refractive index variations within the microchannel environment mod ify the critical angle at the liquid-solid inter-face, thereby altering the characteristics of evanescent field formation in solution. These variation s are evidenced through measurement of fluorescence intensities. Initially, the design and testing of the method are described, Subsequently, refracti ve index values for bulk sucrose solutions (0-35% w/v sucrose in water) are measured using the single point evanescent wave probe and compared with va lues obtained through conventional refractometry and the literature. Close agreement between all three approaches is demonstrated. The method is then applied to the detection of sucrose plugs (10-500 mM) hydrodynamically flow ing through microfabricated channels on a planar glass chip. The evanescent wave probe is also used to selectively monitor specific analytes within a multicomponent system, by precise angular control in the vicinity of the cr itical angle. Although detection limits using the prototype system are non- ideal (similar to 5 muM carbohydrate), they compare favourably with existin g methods for on-chip refractive index detection.