Aluminium nitride was synthesised by remote microwave plasma enhanced chemi
cal vapour deposition. At temperature in the range [823 K - 923 K], AIN thi
n films were synthesised by reaction between AlCl3 and a late Ar- N-2-H-2 p
ost-discharge. Nitrogen atoms are very likely the. main reactive species of
the post-discharge which react with aluminium. trichloride to produce AIN.
The composition of the gas phase was studied by optical emission spectrosc
opy and NO titration to determine the highest density of nitrogen atoms. Hi
ghest deposition rates are close to 3 mum h(-1). Composition of the thin fi
lm is strongly dependent on the operating parameters. In most cases, the me
asured atomic ratio N/Al is greater than 1.